HIGH-RESOLUTION OCDR IN DISPERSIVE WAVE-GUIDES

被引：37

作者：

BRINKMEYER, E

ULRICH, R

机构：

[1] Technische Universität Hamburg-Harburg, Hamburg 90, Eißendorfer Str. 40

来源：

ELECTRONICS LETTERS | 1990年 / 26卷 / 06期

关键词：

Dispersion; Integrated optics; Reflectometry; Waveguides;

D O I：

10.1049/el:19900270

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In the analysis of integrated optical waveguide structures by coherence-domain reflectometry, spatial resolution may be seriously impaired by second order dispersion of the waveguides under test and by the presence of structures in the source spectrum. An algorithm for evaluation of measured interferograms is presented to correct for these effects. It is based on Fourier and wavenumber scale transformations. © 1990, The Institution of Electrical Engineers. All rights reserved.

引用

页码：413 / 414

页数：2

共 4 条

[1] MODIFIED OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY WITH HIGH SPATIAL-RESOLUTION FOR COMPONENTS OF INTEGRATED OPTIC SYSTEMS
BARFUSS, H
BRINKMEYER, E
[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 1989, 7 (01) : 3 - 10
[2] OPTICAL REFLECTOMETRY WITH MICROMETER RESOLUTION FOR THE INVESTIGATION OF INTEGRATED OPTICAL-DEVICES
BEAUD, P
SCHUTZ, J
HODEL, W
WEBER, HP
GILGEN, HH
SALATHE, RP
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1989, 25 (04) : 755 - 759
[3] DANIELSON BL, 1987, APPL OPTICS, V14, P2836
[4] OPTICAL COHERENCE-DOMAIN REFLECTOMETRY - A NEW OPTICAL EVALUATION TECHNIQUE
YOUNGQUIST, RC
CARR, S
DAVIES, DEN
[J]. OPTICS LETTERS, 1987, 12 (03) : 158 - 160

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