AN EVALUATION OF ANALYTICAL TECHNIQUES RELATED TO CADMIUM TELLURIDE PURITY AND PROCESSING

被引:9
作者
DEAN, BE
JOHNSON, CJ
KRAMER, FJ
机构
[1] II-VI Incorporated, Saxonburg, PA
关键词
D O I
10.1016/0022-0248(90)90285-S
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Seven state-of-the-art analytical techniques were applied to CdTe and its precursors. It was shown that GDMS, SSMS, LSMS, and a new technique, TESSA, are the most accurate and useful at impurity levels in the 0.1 to 10 ppma range. © 1990.
引用
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页码:47 / 50
页数:4
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JOURNAL OF CRYSTAL GROWTH, 1986, 78 (01) :58-62
[2]  
ZANIO K, 1978, SEMICONDUCTORS SEMIM, V13