INVESTIGATION FOR SINGLE-EVENT UPSET IN MSI DEVICES

被引：10

作者：

WOODS, JP ^{[1
]}

NICHOLS, DK ^{[1
]}

PRICE, WE ^{[1
]}

机构：

[1] CALTECH,JET PROP LAB,PASADENA,CA 91103

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1981年 / 28卷 / 06期

关键词：

D O I：

10.1109/TNS.1981.4335667

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：4022 / 4025

页数：4

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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2675 - 2680
[2] SIMULATION OF COSMIC-RAY INDUCED SOFT ERRORS AND LATCHUP IN INTEGRATED-CIRCUIT COMPUTER MEMORIES
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) : 5087 - 5091
[3] COSMIC-RAY INDUCED ERRORS IN MOS MEMORY CELLS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) : 1166 - 1171
[4] A STUDY OF SINGLE EVENT UPSETS IN STATIC RAMS
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NICHOLS, DK
SOLIMAN, KA
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1506 - 1508