CONDUCTANCE NOISE INVESTIGATIONS WITH 4 ARBITRARILY SHAPED AND PLACED ELECTRODES

被引：59

作者：

VANDAMME, LKJ ^{[1
]}

VANBOKHOVEN, WMG ^{[1
]}

机构：

[1] EINDHOVEN UNIV TECHNOL,DEPT ELECT ENGN,EINDHOVEN,NETHERLANDS

来源：

APPLIED PHYSICS | 1977年 / 14卷 / 02期

关键词：

D O I：

10.1007/BF00883091

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：205 / 215

页数：11

共 15 条

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DIRECTOR, SW
ROHRER, RA
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[3] MEASUREMENTS OF LOW-FREQUENCY NOISE IN THICK FILM RESISTORS
HAWKINS, RJ
BLOODWORTH, GG
[J]. THIN SOLID FILMS, 1971, 8 (03) : 193 - +
[4] HAWKINS RJ, 1970, THESIS U SOUTHAMPTON, P177
[5] HETTICH A, 1950, FREQUENZ, V4, P14
[6] HONIG EP, 1974, PHILIPS RES REP, V29, P253
[7] 1-F NOISE
HOOGE, FN
[J]. PHYSICA B & C, 1976, 83 (01): : 14 - 23
[8] ISAACSON E, 1966, ANAL NUMERICAL METHO, P442
[9] MONTEATH GD, 1973, APPL ELECTROMAGNETIC, P1
[10] PENFIELD P, 1970, MIT58 RES MON, P79