ABERRATIONS IN HIGH APERTURE CONVENTIONAL AND CONFOCAL IMAGING-SYSTEMS

[1] Abramowitz M., 1970, HDB MATH FUNCTIONS

[2] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[3] BORN M, 1975, PRINCIPLES OPTICS, P461

[4] CHOU CH, UNPUB EVALUATION VZ

[5] DEPTH RESPONSE OF CONFOCAL OPTICAL MICROSCOPES [J]. OPTICS LETTERS, 1986, 11 (12) : 770 - 772

[6] OBSERVATION OF OPTICAL SIGNATURES OF MATERIALS [J]. APPLIED PHYSICS LETTERS, 1982, 41 (07) : 604 - 606

[7] INTERFEROMETRIC MEASUREMENTS OF THE COMPLEX AMPLITUDE OF THE DEFOCUS SIGNAL V(Z) IN THE CONFOCAL SCANNING OPTICAL MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (08) : 2708 - 2712

[8] LEBEDEV NN, 1972, SPECIAL FUNCTIONS TH, P198

[9] MATERIAL CHARACTERIZATION BY THE INVERSION OF V(Z) [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1985, 32 (02): : 213 - 224

[10] MATTHEWS HJ, IN PRESS ABERRATION

[1] Abramowitz M., 1970, HDB MATH FUNCTIONS

[2] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[3] BORN M, 1975, PRINCIPLES OPTICS, P461

[4] CHOU CH, UNPUB EVALUATION VZ

[5] DEPTH RESPONSE OF CONFOCAL OPTICAL MICROSCOPES [J]. OPTICS LETTERS, 1986, 11 (12) : 770 - 772

[6] OBSERVATION OF OPTICAL SIGNATURES OF MATERIALS [J]. APPLIED PHYSICS LETTERS, 1982, 41 (07) : 604 - 606

[7] INTERFEROMETRIC MEASUREMENTS OF THE COMPLEX AMPLITUDE OF THE DEFOCUS SIGNAL V(Z) IN THE CONFOCAL SCANNING OPTICAL MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (08) : 2708 - 2712

[8] LEBEDEV NN, 1972, SPECIAL FUNCTIONS TH, P198

[9] MATERIAL CHARACTERIZATION BY THE INVERSION OF V(Z) [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1985, 32 (02): : 213 - 224

[10] MATTHEWS HJ, IN PRESS ABERRATION