PREDICTION OF SECONDARY ION CURRENTS FOR TRACE-ELEMENTS IN GALLIUM-ARSENIDE IN SECONDARY ION MASS-SPECTROMETRY

被引：12

作者：

MORGAN, AE ^{[1
]}

CLEGG, JB ^{[1
]}

机构：

[1] PHILIPS RES LABS,REDHILL RH1 5HA,SURREY,ENGLAND

来源：

关键词：

D O I：

10.1016/0584-8547(80)80091-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：281 / 285

页数：5

共 9 条

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BROZEL, MR ;

CLEGG, JB ;

NEWMAN, RC .

[2]

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[3] MOLECULAR VERSUS ATOMIC SECONDARY ION EMISSION FROM SOLIDS [J].

MORGAN, AE ;

WERNER, HW .

[4] QUANTITATIVE SIMS STUDIES WITH A URANIUM MATRIX [J].

MORGAN, AE ;

WERNER, HW .

MORGAN, AE ;

WERNER, HW .

[6]

MORGAN AE, 1978, MIKROCHIM ACTA, V2, P31

[7]

MORGAN AE, UNPUBLISHED

[8]

WERNER HW, 1978, ELECTRON ION SPECTRO, P324

[9]

WITTMAACK K, 1974, 6TH P INT C EL ION B, P164