QUANTITATIVE TRACE-ELEMENT ANALYSIS OF MICRODROPLET RESIDUES BY SECONDARY ION MASS-SPECTROMETRY

被引：13

作者：

ODOM, RW

LUX, G

FLEMING, RH

CHU, PK

NIEMEYER, IC

BLATTNER, RJ

机构：

来源：

ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 19期

关键词：

D O I：

10.1021/ac00170a018

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2070 / 2075

页数：6

共 13 条

[1] SIMULTANEOUS DETERMINATION OF TRACE ELEMENTS IN PLATINUM BY ISOTOPE DILUTION AND SPARK SOURCE MASS SPECTROMETRY [J].

ALVAREZ, R ;

PAULSEN, PJ ;

KELLEHER, DE .

ANALYTICAL CHEMISTRY, 1969, 41 (07) :955-&

[2] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J].

ANDERSEN, CA ;

HINTHORNE, JR .

ANALYTICAL CHEMISTRY, 1973, 45 (08) :1421-1438

[3]

BENNINGHOVEN A, 1987, SECONDARY ION MASS S, pCH6

[4]

BONVENTRE JV, 1980, XRAY MICROANALYSIS

[5] LOW-TEMPERATURE ASHING PRECONCENTRATION FOR ELEMENTAL LOCALIZATION IN BIOLOGICAL SOFT-TISSUES BY ION MICROSCOPY [J].

BRENNA, JT ;

MORRISON, GH .

ANALYTICAL CHEMISTRY, 1984, 56 (14) :2791-2797

[6]

BURNS MS, 1984, ANAL ORGANIC BIOL SU

[7] IMAGING ELEMENTAL DISTRIBUTION AND ION-TRANSPORT IN CULTURED-CELLS WITH ION MICROSCOPY [J].

CHANDRA, S ;

MORRISON, GH .

SCIENCE, 1985, 228 (4707) :1543-1544

[8] APPLICATION OF GLOW-DISCHARGE MASS-SPECTROMETRY AND SPUTTERED NEUTRAL MASS-SPECTROMETRY TO MATERIALS CHARACTERIZATION [J].

CHU, PK ;

HUNEKE, JC ;

BLATTNER, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (03) :295-301

[9]

DEGREVE F, 1986, SECONDARY ION MASS S, P388

[10] MODERN EXPERIMENTAL METHODS FOR SURFACE AND THIN-FILM CHEMICAL-ANALYSIS [J].

EVANS, CA ;

BLATTNER, RJ .

ANNUAL REVIEW OF MATERIALS SCIENCE, 1978, 8 :181-214

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