CONTACT RESISTANCE AND SATURATION EFFECTS IN THE SCANNING TUNNELLING MICROSCOPE - THE RESISTANCE QUANTUM UNIT

被引：16

作者：

MARTINRODERO, A

FERRER, J

FLORES, F

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01392.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：317 / 323

页数：7

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