DIFFERENTIAL REFLECTOMETRY OF SPUTTERED SILVER-ALUMINUM FILMS BETWEEN 1.6 AND 6.2 EV

被引：3

作者：

HUMMEL, RE ^{[1
]}

机构：

[1] UNIV PARIS 06, OPT SOLIDES LAB, F-75230 PARIS 05, FRANCE

来源：

OPTICS COMMUNICATIONS | 1981年 / 39卷 / 1-2期

关键词：

D O I：

10.1016/0030-4018(81)90454-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：55 / 58

页数：4

共 16 条

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