2ND-ORDER SPACE FOCUSING IN 2-FIELD TIME-OF-FLIGHT MASS SPECTROMETERS

被引：48

作者：

ELAND, JHD

机构：

[1] Phys. Chem. Lab., Oxford Univ.

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1993年 / 4卷 / 12期

关键词：

Acceleration - Diffusion - Focusing - Instrument testing - Ion sources - Ions - Linearization - Mathematical models - Optical resolving power - Turnaround time - Velocity;

D O I：

10.1088/0957-0233/4/12/035

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Design equations are given for second-order space focusing in two-field time-of-flight mass spectrometers. Simulations and experimental tests confirm that, for diffuse sources and high-energy fragments, second-order designs give superior resolution and linearity of flight time deviations to initial ion velocities.

引用

页码：1522 / 1524

页数：3

共 4 条

[1] A PHOTOELECTRON ION ION TRIPLE COINCIDENCE TECHNIQUE FOR THE STUDY OF DOUBLE PHOTOIONIZATION AND ITS CONSEQUENCES [J].