DETERMINATION OF COUPLING CAPACITANCE OF UNDERPASSES, AIR BRIDGES AND CROSSINGS IN MICS AND MMICS

被引：17

作者：

WIEMER, L ^{[1
]}

JANSEN, RH ^{[1
]}

机构：

[1] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCHESTER NN12 8EQ,NORTHANTS,ENGLAND

来源：

ELECTRONICS LETTERS | 1987年 / 23卷 / 07期

关键词：

DIELECTRIC MATERIALS;

D O I：

10.1049/el:19870254

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The coupling capacitance of galvanically separated conductor crossings of general geometry is determined using a static spectral domain approach. The presence of a multilayer dielectric medium as used in modern MMICs is considered. Results are presented for a wide range of conductor widths on a 200 mu m GaAs substrate with additional dielectric layers.

引用

页码：344 / 346

页数：3

共 9 条

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[9]

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