共 12 条
- [2] CAHILL TA, 1975, NEW USES ION ACCELER, P1
- [5] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03): : 487 - 499
- [6] MCCALLUM GJ, 1973, INSP114
- [7] RAO TSS, 1972, 6TH P INT C XRAY OPT
- [8] ROBINSON DC, 1973, INSP113
- [9] SUTER M, 1975, HELV PHYS ACTA, V48, P511
- [10] ANALYSIS OF SURFACE-LAYERS BY ELASTIC BACKSCATTERING [J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 104 (01): : 117 - +