CHARACTERIZATION OF 2 RESISTIVE ANODE ENCODER POSITION-SENSITIVE DETECTORS FOR USE IN ION MICROSCOPY

Both the standard resistive anode encoder (RAE) position sensitive ion detector and a new faster version have been adapted for use with CAMECA IMS-3f/4f imaging secondary-ion mass spectroscopy instruments. Each detector includes a dual microchannel plate image intensifier mounted in front of a resistive anode. The conversion efficiencies of the standard and fast detectors are 60% and 55%, respectively. The high count rates attainable with the fast detector require high strip-current microchannel plates for optimum performance. The mass bias of these detectors is proportional to (mass)1/2 and can be compensated by adjustment of detector supply voltage. The response across the active area of these detectors is uniform to within 3% with the greatest deviations occurring at the periphery. Distortion and pixel-to-pixel bias are negligible with the standard RAE, but noticeable in the prototype of the fast RAE. Software has been developed that corrects pixel-to-pixel bias. The dead times of the standard and fast RAE systems are 4.3 +/- 0.1 mus and 330 +/- 2 ns which limit practical count rates to about 40 000 and 600 000 Hz, respectively. For many applications, the higher ion arrival rates and dynamic range of the fast RAE imaging system more than compensate for the increased pixel-to-pixel bias and distortion and the small decrease in conversion efficiency.