HOW ACCURATE IS THE FUNDAMENTAL PARAMETER APPROACH - XRF ANALYSIS OF BULK AND MULTILAYER SAMPLES

被引：48

作者：

DEBOER, DKG ^{[1
]}

BORSTROK, JJM ^{[1
]}

LEENAERS, AJG ^{[1
]}

VANSPRANG, HA ^{[1
]}

BROUWER, PN ^{[1
]}

机构：

[1] PHILIPS ANALYT,7602 EA ALMELO,NETHERLANDS

来源：

X-RAY SPECTROMETRY | 1993年 / 22卷 / 01期

关键词：

D O I：

10.1002/xrs.1300220109

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The accuracy of Fundamental Parameter-based XRF quantification is investigated for both bulk and multilayer analysis. It is found that for bulk materials the relative accuracy is of the order of 1 % and for multilayers a few percent. The method can be set up in such a way that it contains an inherent validity check. Further possibilities of the Fundamental Parameter method are discussed.

引用

页码：33 / 38

页数：6

共 16 条

[1]

[Anonymous], 1988, NUMERICAL RECIPES AR

[2]

BEKKERS M, COMMUNICATION

[3] COMPARISON OF FUNDAMENTAL PARAMETERS PROGRAMS FOR QUANTITATIVE X-RAY-FLUORESCENCE SPECTROMETRY [J].