K-SHELL IONIZATION UNDER ZONE-AXIS ELECTRON-DIFFRACTION CONDITIONS

被引：19

作者：

JOSEFSSON, TW ^{[1
]}

ALLEN, LJ ^{[1
]}

MILLER, PR ^{[1
]}

ROSSOUW, CJ ^{[1
]}

机构：

[1] CSIRO,DIV MAT SCI & TECHNOL,CLAYTON,VIC 3169,AUSTRALIA

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.50.6673

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A comprehensive theoretical treatment for the inelastic scattering of fast electrons in a crystalline environment is applied to account for variations in characteristic x-ray emission rates from spinel and chromia under zone-axis diffraction conditions for 300-keV electrons. X-ray counts as well as backscattered-electron contrast are recorded as the beam is tilted by about 70 mrad on a two-dimensional scan raster. Calculated K-shell ionization and backscattering cross sections, based on a model which takes into account interaction delocalization, thermal diffuse scattering, and the consequent thickness-dependent channeling effects in a realistic way, are in good agreement with experiment.

引用

页码：6673 / 6684

页数：12

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