LOCALLY WEIGHTED REGRESSION AND SCATTER CORRECTION FOR NEAR-INFRARED REFLECTANCE DATA

被引：246

作者：

NAES, T ^{[1
]}

ISAKSSON, T ^{[1
]}

KOWALSKI, B ^{[1
]}

机构：

[1] UNIV WASHINGTON,CHEMOMETR LAB,SEATTLE,WA 98195

来源：

ANALYTICAL CHEMISTRY | 1990年 / 62卷 / 07期

关键词：

D O I：

10.1021/ac00206a003

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

This paper Investigates the effect of multiplicative scatter correction (MSC) and nonlinear regression based on the first two and three principal components for near-infrared reflectance (NIR) spectroscopy data. The focus will be on llne-arlty/nonlinearity as well as treatment of outliers. The main contribution of the paper is the presentation of and testing of a calbration method based on classification and local least-squares regression. The theory Is Illustrated by three examples from NIR analysis. The local linear calibration outperformed traditional methods In two of the examples. © 1990, American Chemical Society. All rights reserved.

引用

页码：664 / 673

页数：10

共 24 条

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