NEW SURFACE-STRUCTURE ANALYSIS OF AG-SI PHASE BY QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY METHOD

被引：15

作者：

TOKUTAKA, H

NISHIMORI, K

NOMURA, S

TANAKA, A

TAKASHIMA, K

机构：

来源：

SURFACE SCIENCE | 1982年 / 115卷 / 01期

关键词：

D O I：

10.1016/0039-6028(82)90662-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：79 / 90

页数：12

共 18 条

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[17] QUANTITATIVE AES METHOD FOR THE STUDY OF A MONOLAYER OVER-GROWTH OF THIN-FILM [J].

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[18] INTRODUCTION OF A CALIBRATION LINE FOR COMPOSITION DETERMINATION OF A BINARY ALLOY BY AUGER-ELECTRON SPECTROSCOPY (QUANTITATIVE FORMALISM) [J].

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