MEASUREMENT OF SURFACE RESONANCE BANDS ON W(001)

被引:3
作者
MCRAE, EG
机构
来源
PHYSICAL REVIEW B | 1978年 / 17卷 / 02期
关键词
D O I
10.1103/PhysRevB.17.907
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Measurements of electronic surface resonance bands on W(001) by a secondary-emission method (Willis, Feuerbacher, and Christensen) are compared with results extracted from published low-energy-electron diffraction measurements. The results from the two methods are generally similar. Quantitative discrepancies exist but are not large enough to invalidate either method as a means of testing theoretical surface resonance band structure. © 1978 The American Physical Society.
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页码:907 / 908
页数:2
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