PERIODICITY IN THICKNESS OF ELECTRON-MICROSCOPE CRYSTAL-LATTICE IMAGES

被引：30

作者：

FEJES, PL ^{[1
]}

IIJIMA, S ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1973年 / A 29卷 / NOV1期

关键词：

D O I：

10.1107/S0567739473001737

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：710 / &

共 8 条

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OKEEFE, MA
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COWLEY, JM
IIJMA, S
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 445 - +
[4] EVALUATION OF N-BEAM DYNAMIC ELECTRON DIFFRACTION INTENSITIES BY MATRIX METHOD
FISHER, PMJ
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[5] HIGH-RESOLUTION ELECTRON MICROSCOPY OF CRYSTAL LATTICE OF TITANIUM-NIOBIUM OXIDE
IIJIMA, S
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5891 - +
[6] DIRECT OBSERVATION OF LATTICE DEFECTS IN H-NB2O5 BY HIGH-RESOLUTION MICROSCOPY
IIJIMA, S
[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1973, 29 (JAN1): : 18 - +
[7] IIJIMA S, IN PRESS
[8] IIJIMA S, 1972, 30 P EL MICR SOC AM, P556