On the Elastoresistance Effect in Evaporated Tellurium Films

The electrical resistance-strain coefficients of thin evaporated films of tellurium have been measured. A relaxation phenomenon is observed: the time constant is greater than 10 min; the longitudinal gauge factor is about 40, the resistivitiy 5 x 10(-2) Omega cm, and the thermal sensitivity near room temperature is great (about -10(-2)/deg). Several treatments have been used to decrease this time constant: diffusion of Sb, Bi, Ag and deposit of Sb, Ag. The most interesting results are obtained with silver: the deposit of Ag on tellurium films decreases the time constant to 1 min and less. The diffusion of Ag in tellurium films increases the longitudinal gauge factor to 60 with a great time constant. Oxidation improves this time constant.