SURFACE CHARACTERIZATION OF CERAMIC MEMBRANES BY ATOMIC-FORCE MICROSCOPY

被引:32
作者
BOTTINO, A
CAPANNELLI, G
GROSSO, A
MONTICELLI, O
CAVALLERI, O
ROLANDI, R
SORIA, R
机构
[1] UNIV GENOA,DIPARTIMENTO FIS,I-16146 GENOA,ITALY
[2] SOC CERAM TECH,F-65460 BAZET,FRANCE
关键词
ATOMIC FORCE MICROSCOPY; CERAMIC MEMBRANES; SURFACE FEATURES;
D O I
10.1016/0376-7388(94)00132-4
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Atomic force microscopy (AFM) has been used to investigate the surface of ultrafiltration and microfiltration ceramic membranes. The AFM has been shown to resolve the feature of the gamma-Al2O3 selective skin layer of ultrafiltration membranes providing information on both the size and shape of the gamma-Al2O3 particles as well as the surface roughness of the skin. When applied to study alpha-Al2O3 microfiltration membranes the AFM has been shown to yield results very similar to those obtained by conventional scanning electron microscopy.
引用
收藏
页码:289 / 296
页数:8
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