QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：165

作者：

POWELL, CJ ^{[1
]}

LARSON, PE ^{[1
]}

机构：

[1] GCA MCPHERSON INSTRUMENT CORP, ACTON, MA 01720 USA

来源：

APPLIED SURFACE SCIENCE | 1978年 / 1卷 / 02期

关键词：

D O I：

10.1016/0378-5963(78)90014-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：186 / 201

页数：16

相关论文

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[8] WIDTHS OF ATOMIC 4S AND 4P VACANCY STATES, 46 LESS THAN OR EQUAL TO Z LESS THAN OR EQUAL TO 50
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