ANALYSIS OF MULTILAYER THIN-FILM STRUCTURES CONTAINING MAGNETOOPTIC AND ANISOTROPIC MEDIA AT OBLIQUE-INCIDENCE USING 2X2 MATRICES

被引：153

作者：

MANSURIPUR, M

机构：

[1] Optical Sciences Center, University of Arizona, Tucson

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 10期

关键词：

D O I：

10.1063/1.345121

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.

引用

页码：6466 / 6475

页数：10

共 10 条

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