DIFFUSION-INDUCED MIGRATION OF GRAIN-BOUNDARIES AND LIQUID-FILMS

被引：12

作者：

CHAKI, TK

机构：

[1] Department of Mechanical and Aerospace Engineering, State University of New York, Buffalo, NY

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1990年 / 62卷 / 04期

关键词：

D O I：

10.1080/01418619008244791

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A model is proposed to explain diffusion-induced migration of a grain boundary or a liquid film on a unified basis. The driving energies for both phenomena are identified as the interface free energy and the free energy of mixing, the latter being predominant in most cases. The grain boundary or the liquid film migrates owing to thermally activated motion of atoms across the interface under the influence of the driving energies. An expression for the velocity of migration is derived, and it is shown that this depends parabolically on solute concentration. The model explains numerous experimental facts. © 1990 Taylor & Francis Group, LLC.

引用

页码：465 / 471

页数：7

共 22 条

[1]

[Anonymous], 1973, SELECTED VALUES THER

[2] MIGRATION OF LIQUID-FILM AND GRAIN-BOUNDARY IN MO-NI INDUCED BY TEMPERATURE-CHANGE [J].