Hexagonal close-packed (HCP) C-60 and C-70 films have been prepared by the Langmuir method and examined by electron microscopy and electron-diffraction analysis. It has been shown that the vacuum deposition of a C-60 + C-70 mixture results in the formation of a film with small sized grains and a distorted C-60-HCP structure. The simultaneous deposition of C-60 and ferrocene results in the formation of a film with a changed morphology and an electron-diffraction pattern that contains a variable amount of ferrocene depending on the experimental conditions. The electron-diffraction pattern corresponds to the presence of the known molecular complex C-60[(C5H5)(2)Fe](2). The analogous simultaneous deposition of fullerene C-60 and cobaltocene results in the formation of a C-60 film stable in air and water, which contains carbon and cobalt (from the data of X-ray fluorescence, electron microscopy and microdiffraction). It has a different morphology and different diffraction patterns than pure C-60 films and, depending on the cobaltocene content (relative to that of fullerene), appears to be a fullerite film doped with various amounts of cobaltocenium fulleride, which is an ionic compound.