A 77-1300 K SINGLE CRYSTAL X-RAY SPECIMEN CHAMBER

被引:18
作者
GEHLEN, PC
机构
[1] Metal Science Group, Battelle Memorial Institute, Columbus Laboratories, Columbus
关键词
D O I
10.1063/1.1684044
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An x-ray specimen chamber suited for single crystal diffraction work (particularly for studies of the state of order in alloys) is described. The evacuated chamber can be used between 77 and 1300 K. Temperatures can be controlled to ±1°. The chamber has its own degrees of freedom and no auxiliary equipment is needed to bring any crystallographic plane into diffracting position. The two degrees of freedom provided (the so called φ and κ rotations) permit investigation of large parts of reciprocal space, using only one face of a large flat crystal. As an example of the versatility of the camera, the lattice parameter of copper was measured between 100 and 1200 K. © 1969 The American Institute of Physics.
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页码:715 / &
相关论文
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