CHARACTERIZATION OF THE SIC AND TIN WHISKER MICROSTRUCTURE

被引：10

作者：

ZHU, J ^{[1
]}

NING, XG ^{[1
]}

XU, HG ^{[1
]}

HU, KY ^{[1
]}

CAO, W ^{[1
]}

YE, HQ ^{[1
]}

机构：

[1] ACAD SINICA,INST MET RES,ATOM IMAGING SOLIDS LAB,SHENYANG 110015,PEOPLES R CHINA

来源：

JOURNAL OF MATERIALS SCIENCE | 1991年 / 26卷 / 12期

关键词：

D O I：

10.1007/BF01124664

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Five criteria for evaluating the whisker microstructure have been suggested, which include (1) proportion of "perfect" single crystals, (2) morphology and growth direction, (3) length, diameter and ratio of L/D, (4) the bulk and surface chemistries, (5) defects and their distribution. Three sets of commercially available SiC whiskers made in two countries and the TiN whiskers were characterized in terms of the above criteria.

引用

页码：3202 / 3208

页数：7

共 9 条

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