ELECTRON DISPLACEMENT DAMAGE IN COBALT IN A HIGH VOLTAGE ELECTRON MICROSCOPE

被引：26

作者：

HOWE, LM

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1970年 / 22卷 / 179期

关键词：

D O I：

10.1080/14786437008221067

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：965 / &

共 27 条

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