THE APPLICATION OF X-RAY-DIFFRACTION MEASUREMENTS IN THE GROWTH OF LPE INGAASP-INP

被引：9

作者：

TASHIMA, MM ^{[1
]}

COOK, LW ^{[1
]}

STILLMAN, GE ^{[1
]}

机构：

[1] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801

来源：

JOURNAL OF CRYSTAL GROWTH | 1981年 / 54卷 / 01期

关键词：

D O I：

10.1016/0022-0248(81)90259-1

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

收藏

页码：132 / 137

页数：6

相关论文

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[2] LIQUID-PHASE EPITAXIAL-GROWTH OF LATTICE-MATCHED INGAASP ON (100)-INP FOR 1.15-1.31-MU-M SPECTRAL REGION
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[J]. APPLIED PHYSICS LETTERS, 1978, 33 (11) : 962 - 964
[6] COMPOSITIONAL INHOMOGENEITY OF LIQUID-PHASE EPITAXIAL INGAPAS LAYERS OBSERVED DIRECTLY IN PHOTO-LUMINESCENCE
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