MIXED-VALENCE AND 4F SURFACE CHEMICAL-SHIFT IN CEN

被引：27

作者：

GUDAT, W

ROSEI, R

WEAVER, JH

KALDIS, E

HULLIGER, F

机构：

[1] SWISS FED INST TECHNOL, FESTKORPERPHYS LAB, CH-8093 ZURICH, SWITZERLAND

[2] SYNCHROTRON RADIAT CTR, STOUGHTON, WI USA

来源：

SOLID STATE COMMUNICATIONS | 1982年 / 41卷 / 01期

关键词：

D O I：

10.1016/0038-1098(82)90245-9

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：37 / 42

页数：6

共 26 条

[1] SURFACE MIXED-VALENCE IN SM AND SMB6
ALLEN, JW
JOHANSSON, LI
LINDAU, I
HAGSTROM, SB
[J]. PHYSICAL REVIEW B, 1980, 21 (04): : 1335 - 1343
[2] RESONANT PHOTOEMISSION-STUDIES OF MIXED-VALENCE, REDUCED-MOMENT, AND ANTI-FERROMAGNETIC CERIUM COMPOUNDS
ALLEN, JW
OH, SJ
LINDAU, I
LAWRENCE, JM
JOHANSSON, LI
HAGSTROM, SB
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (16) : 1100 - 1103
[3] HOLE LIFETIME AND CHEMICAL-SHIFT OF THE 4F LEVELS IN YB METAL
ALVARADO, SF
CAMPAGNA, M
GUDAT, W
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (1-2) : 43 - 49
[4] ELECTRONIC-STRUCTURE OF CEN STUDIED BY X-RAY-PHOTOEMISSION SPECTROSCOPY
BAER, Y
ZURCHER, C
[J]. PHYSICAL REVIEW LETTERS, 1977, 39 (15) : 956 - 959
[5] X-RAY PHOTOEMISSION STUDY OF CE-PNICTIDES
BAER, Y
HAUGER, R
ZURCHER, C
CAMPAGNA, M
WERTHEIM, GK
[J]. PHYSICAL REVIEW B, 1978, 18 (08): : 4433 - 4439
[6] CORE-HOLE SCREENING IN LANTHANIDE METALS
CRECELIUS, G
WERTHEIM, GK
BUCHANAN, DNE
[J]. PHYSICAL REVIEW B, 1978, 18 (12): : 6519 - 6524
[7] Croft M., 1981, Valence Fluctuations in Solids. International Conference on Valence Fluctuations in Solids, P401
[8] FUNDAMENTAL PARAMETERS AND MECHANISMS IN THE CE PROBLEM - PHOTOEMISSION RESULTS ON CEAL2 AND CEAL2 ALLOYS
CROFT, M
WEAVER, JH
PETERMAN, DJ
FRANCIOSI, A
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (16) : 1104 - 1107
[9] EASTMAN DE, 1980, PHYS REV LETT, V45, P656, DOI 10.1103/PhysRevLett.45.656
[10] OBSERVATION OF A RELATIONSHIP BETWEEN CORE-LEVEL LINE-SHAPES IN PHOTOELECTRON-SPECTROSCOPY AND THE LOCALIZATION OF SCREENING ORBITALS
FUGGLE, JC
CAMPAGNA, M
ZOLNIEREK, Z
LASSER, R
PLATAU, A
[J]. PHYSICAL REVIEW LETTERS, 1980, 45 (19) : 1597 - 1600

← 1 2 3 →