FABRICATION AND BARRIER DIAGNOSTICS OF SUPERCONDUCTIVE TUNNEL-JUNCTIONS ON NB-SN AND V-SI

被引:22
作者
RUDMAN, DA
HOWARD, RE
MOORE, DF
ZUBECK, RB
BEASLEY, MR
机构
[1] IBM CORP,SAN JOSE,CA 95193
[2] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
[3] STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
关键词
D O I
10.1109/TMAG.1979.1060080
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The procedures found to lead to good tunnel junctions on the Al5 superconductor Nb-Sn are described. The use of an acetic acid atmosphere and/or oxidized Si layer barriers is shown to be particularly effective. The role of excess Sn in good oxide barrier formation on bare Nb-Sn is discussed. These results are related to earlier work using oxidized Si barriers on V3Si. © 1979 IEEE
引用
收藏
页码:582 / 584
页数:3
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