CHANNELING EFFECTS IN ELECTRON INDUCED X-RAY-EMISSION FROM DIATOMIC CRYSTALS

被引：36

作者：

TAFTO, J ^{[1
]}

机构：

[1] UNIV OSLO,DEPT PHYS,OSLO,NORWAY

来源：

ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES | 1979年 / 34卷 / 04期

关键词：

D O I：

10.1515/zna-1979-0407

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The variation of x-ray emission with direction of the incident beam has been studied in diatomic crystals of ZnS, ZnSe and FeS2 using an electron microscope at 80 keV attached with a Si(Li) x-ray detector. The interpretation is based on the Bloch wave picture taking into account absorption and diffuse scattering of the electrons. © 1979, Walter de Gruyter. All rights reserved.

引用

页码：452 / 458

页数：7

共 11 条

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