IMAGE ABERRATIONS OF AXIALLY-SYMMETRIC IMAGING-SYSTEMS WITH OFF-AXIAL RAYS - 3-DIMENSIONALLY IMAGING ELECTRON-MICROSCOPES .3.

被引：8

作者：

TYPKE, D

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 187卷 / 01期

关键词：

D O I：

10.1016/0029-554X(81)90491-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：217 / 226

页数：10

共 31 条

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