ON DEFLECTION OF A QUADRATIC-LINEAR TEST STATISTIC

被引:12
作者
BAKER, CR
机构
[1] Department of Statistics, University of North Carolina, Chapel Hill, N.C
关键词
D O I
10.1109/TIT.1969.1054267
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The deflection of a bounded quadratic-linear test statistic is considered for the following binary detection problem. Hypothesis H1-received. waveform is a sample function from a random process with known covariance and mean functions, but unknown probability distributions, versus H2-received. waveform is a sample function from a Gaussian process (noise) having known. covariance and mean functions. Sample functions are assumed to belong to a real and separable Hilbert space. The test statistic is assumed to be the sum of a bounded quadratic operation and a bounded linear operation on the data. Necessary and sufficient conditions for the deflection to be bounded over all non-null bounded quadratic-linear operations are given, and additional results are obtained under the assumption that the deflection is bounded. Several relations are shown to exist between the deflection problem and the optimum discrimination problem when both processes are Gaussian. In particular, it is shown that nonsingular © 1969, IEEE. All Rights Reserved.
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页码:16 / +
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