CRITICAL-BEHAVIOR OF THE ELECTRICAL-RESISTANCE AND ITS NOISE IN INVERTED RANDOM-VOID SYSTEMS

被引:23
作者
BALBERG, I
WAGNER, N
HEARN, DW
VENTURA, JA
机构
[1] UNIV FLORIDA,DEPT IND & SYST ENGN,GAINESVILLE,FL 32611
[2] UNIV MISSOURI,DEPT IND ENGN,COLUMBIA,MO 65211
关键词
D O I
10.1103/PhysRevLett.60.1887
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1887 / 1890
页数:4
相关论文
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