VOLTAGE DEPENDENCE OF MAXIMUM OBSERVABLE THICKNESS BY ELECTRON-MICROSCOPY UP TO 3 MV

被引：23

作者：

FUJITA, H ^{[1
]}

TABATA, T ^{[1
]}

机构：

[1] OSAKA UNIV,FAC ENGN,DEPT MET,SUITA,OSAKA,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1973年 / 12卷 / 03期

关键词：

D O I：

10.1143/JJAP.12.471

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：471 / 472

页数：2

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