THE EFFECTS OF SURFACE-TOPOGRAPHY IN NUCLEAR MICROPROBE RUTHERFORD BACKSCATTERING ANALYSIS

被引：22

作者：

HOBBS, CP ^{[1
]}

MCMILLAN, JW ^{[1
]}

PALMER, DW ^{[1
]}

机构：

[1] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND

来源：

关键词：

D O I：

10.1016/0168-583X(88)90023-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：342 / 348

页数：7

共 31 条

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EDGE, RD
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