CROSS-SECTION TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF ULTRATHIN FILMS OF COBALT IN MULTILAYERS

被引：3

作者：

MLIKI, N

RENARD, D

GALTIER, M

NIHOUL, G

机构：

[1] INST NATL RECH SCI & TECH,BORDJ CEDRIA,HAMMAM LIF 2050,TUNISIA

[2] UNIV ORSAY,IO,F-91405 ORSAY,FRANCE

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1992年 / 3卷 / 01期

关键词：

D O I：

10.1051/mmm:019920030105500

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present results obtained by cross section transmission electron microscopy on ultrathin cobalt films, i.e. with a thickness going down to 0.5 nm, separated by gold layers. Observation of the profile views shows that our films are continuous, even for the smallest thickness, a fact which had not been proven until now.

引用

页码：55 / 59

页数：5

共 4 条

[1] MAGNETIC-PROPERTIES OF FERROMAGNETIC THIN SANDWICHES CORRELATED TO THEIR CRYSTALLOGRAPHIC STRUCTURE AND INTERFACE MORPHOLOGY - HREM AND NMR-STUDY [J].