CALCULATED IMAGES OF CRYSTAL LATTICES BY AXIAL ILLUMINATION WITH 1-MEV ELECTRONS

被引：17

作者：

BOURRET, A ^{[1
]}

DESSEAUX, J ^{[1
]}

RENAULT, A ^{[1
]}

机构：

[1] CEN,DEPT RECH FONDAMENTALE,SECT PHYS SOLIDE,BP 85,38041 GRENOBLE,FRANCE

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1975年 / 31卷 / NOV1期

关键词：

D O I：

10.1107/S0567739475001611

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：746 / 752

页数：7

共 11 条

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[3] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS
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[6] HANSSEN KJ, 1971, OPTIK, V32, P519
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[8] DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .2. DEVELOPMENT OF A DYNAMICAL THEORY
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 263 (1312) : 217 - +
[9] Komota T., 1964, OPTIK, V21, P93
[10] THE THEORETICAL RESOLUTION LIMIT OF THE ELECTRON MICROSCOPE
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