THE MERCURY-INDIUM PHOSPHIDE DIODE

被引:11
作者
TUCK, B
HAYESGILL, BR
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 60卷 / 01期
关键词
D O I
10.1002/pssa.2210600126
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:215 / 223
页数:9
相关论文
共 12 条
[1]   STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1589-+
[2]   MEASUREMENT OF CARRIER-CONCENTRATION PROFILES IN EPITAXIAL INDIUM PHOSPHIDE [J].
CARDWELL, MJ ;
PEART, RF .
ELECTRONICS LETTERS, 1973, 9 (04) :88-89
[4]  
HAMMER R, 1969, REV SCI INSTR, V40, P292
[5]  
HUGHES FD, 1972, ACTA ELECTRON, V15, P43
[6]   MERCURY PROBE C-U MEASUREMENTS ON GAP [J].
JAY, PR ;
TUCK, B .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 46 (01) :199-208
[7]  
Rhoderick E.H., 1978, METAL SEMICONDUCTORS
[8]   CAPACITANCE-VOLTAGE MEASUREMENTS WITH A MERCURY-SILICON DIODE [J].
SEVERIN, PJ ;
POODT, GJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (10) :1384-&
[9]   SLOW VOLTAGE-INDUCED BARRIER HEIGHT CHANGES IN METAL-GERMANIUM SURFACE BARRIERS [J].
THANAILAKIS, A ;
NORTHROP, DC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (11) :1776-+
[10]   ELECTRICAL MEASUREMENTS ON HOMOGENEOUS DIFFUSED P-TYPE INP [J].
TUCK, B ;
ZAHARI, MD .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (18) :2473-2479