学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
CHARACTERISTICS OF A DEPLETION-TYPE IGFET
被引:14
作者
:
HUANG, JST
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,SOLID STATE ELECTR CTR,PLYMOUTH,MN 55441
HONEYWELL INC,SOLID STATE ELECTR CTR,PLYMOUTH,MN 55441
HUANG, JST
[
1
]
机构
:
[1]
HONEYWELL INC,SOLID STATE ELECTR CTR,PLYMOUTH,MN 55441
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1973年
/ ED20卷
/ 05期
关键词
:
D O I
:
10.1109/T-ED.1973.17687
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:513 / 514
页数:2
相关论文
共 5 条
[1]
COBBOLD RSC, 1964, P I ELECTR ENG, V111, P1981
[2]
A SIMPLE DERIVATION FIELD-EFFECT TRANSISTOR CHARACTERISTICS
[J].
MIDDLEBROOK, RD
论文数:
0
引用数:
0
h-index:
0
MIDDLEBROOK, RD
.
PROCEEDINGS OF THE IEEE,
1963,
51
(08)
:1146
-&
[3]
POWER-LAW NATURE OF FIELD-EFFECT TRANSISTOR EXPERIMENTAL CHARACTERISTCS
[J].
RICHER, I
论文数:
0
引用数:
0
h-index:
0
RICHER, I
;
MIDDLEBROOK, RD
论文数:
0
引用数:
0
h-index:
0
MIDDLEBROOK, RD
.
PROCEEDINGS OF THE IEEE,
1963,
51
(08)
:1145
-&
[4]
BASIC LIMITS ON THE PROPERTIES OF FIELD-EFFECT TRANSISTORS
[J].
RICHER, I
论文数:
0
引用数:
0
h-index:
0
RICHER, I
.
SOLID-STATE ELECTRONICS,
1963,
6
(05)
:539
-542
[5]
[No title captured]
←
1
→
共 5 条
[1]
COBBOLD RSC, 1964, P I ELECTR ENG, V111, P1981
[2]
A SIMPLE DERIVATION FIELD-EFFECT TRANSISTOR CHARACTERISTICS
[J].
MIDDLEBROOK, RD
论文数:
0
引用数:
0
h-index:
0
MIDDLEBROOK, RD
.
PROCEEDINGS OF THE IEEE,
1963,
51
(08)
:1146
-&
[3]
POWER-LAW NATURE OF FIELD-EFFECT TRANSISTOR EXPERIMENTAL CHARACTERISTCS
[J].
RICHER, I
论文数:
0
引用数:
0
h-index:
0
RICHER, I
;
MIDDLEBROOK, RD
论文数:
0
引用数:
0
h-index:
0
MIDDLEBROOK, RD
.
PROCEEDINGS OF THE IEEE,
1963,
51
(08)
:1145
-&
[4]
BASIC LIMITS ON THE PROPERTIES OF FIELD-EFFECT TRANSISTORS
[J].
RICHER, I
论文数:
0
引用数:
0
h-index:
0
RICHER, I
.
SOLID-STATE ELECTRONICS,
1963,
6
(05)
:539
-542
[5]
[No title captured]
←
1
→