DETERMINATION OF THE CRITICAL THICKNESS AND THE SENSITIVITY FOR THIN-FILM ANALYSIS BY TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

被引：125

作者：

KLOCKENKAMPER, R

VONBOHLEN, A

机构：

来源：

关键词：

D O I：

10.1016/0584-8547(89)80051-5

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：461 / 469

页数：9

共 15 条

[1] BENDIXEN F, IN PRESS
[2] Bertin E. P., 1975, PRINCIPLES PRACTICE
[3] COLBY JW, 1968, ADVANCES XRAY ANALYS, V11, P287
[4] DEBOER D, COMMUNICATION
[5] HENKE BL, 1967, AFOSR671254 OFF SCI
[6] KAISER H, 1974, METHODICUM CHIMICUM
[7] QUANTIFICATION IN TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF MICROTOME SECTIONS
KLOCKENKAMPER, R
VONBOHLEN, A
WIECKEN, B
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) : 511 - 517
[8] KNOTH J, COMMUNICATION
[9] Liebhafsky H. A., 1972, XRAYS ELECTRONS ANAL
[10] MCMASTER WH, 1969, UCRL50174 US AT EN C