BACKSCATTERED ELECTRON IMAGING - THEORY AND APPLICATIONS

被引:9
作者
CARTER, HW
机构
关键词
D O I
10.1016/0047-7206(80)90009-6
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:259 / 260
页数:2
相关论文
共 8 条
[1]
ABRAHAM JL, 1977, SCANNING ELECTRON MI, V2, P119
[2]
Becker R P, 1979, Scan Electron Microsc, P835
[3]
MOLL SH, 1979, SCANNING ELECTRON MI, V2
[4]
Oatley C.W., 1966, ADV ELECTRON, V21, P181, DOI DOI 10.1016/S0065-2539(08)61010-0
[5]
OATLEY CW, 1972, SCANNING ELECTRON 1
[6]
Robinson V. N. E., 1975, Scanning Electron Microscopy 1975, P51
[7]
TANNENBAUM M, 1978, SCANNING ELECTRON MI, V2, P949
[8]
Wells O.C., 1977, SCANNING ELECTRON MI, VI, P747