ELECTRON-SCATTERING BY SUPERCOOLED LIQUID LEAD

被引:4
作者
BRAH, AS
UNVALA, BA
VIRDHEE, L
机构
[1] Department of Metallurgy and Materials Science, Imperial College of Science and Technology, London
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1979年 / 40卷 / 04期
关键词
D O I
10.1080/01418637908227172
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Scanning transmission electron diffraction with energy filtering has been used to study thin films of supercooled liquid lead (thickness 5-60 Å) grown on graphite substrates under UHV conditions. The liquid structure factor was determined (after applying appropriate corrections) by using the high-angle-fitting and the Krogh-Moe methods. The reliability of the normalization was assessed by the Rahmancriterion; this gave an accuracy of 1 % for the structure factor for Q=0·5 to 11·0 Å-1. © 1979 Taylor & Francis Ltd.
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页码:335 / 339
页数:5
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