HIGH-RESOLUTION TOPOGRAPHICAL IMAGING BY DIRECT TRANSMISSION ELECTRON-MICROSCOPY

被引：12

作者：

CULLIS, AG ^{[1
]}

MAHER, DM ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

PHILOSOPHICAL MAGAZINE | 1974年 / 30卷 / 02期

关键词：

D O I：

10.1080/14786439808206570

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：447 / 451

页数：5

共 10 条

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[3] DUPOUY G, 1966, CR ACAD SCI B PHYS, V262, P1063
[4] FAGET J, 1960, P EUR REG C EL MICR, P18
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HALL, CE
[J]. JOURNAL OF APPLIED PHYSICS, 1948, 19 (02) : 198 - 212
[6] ELECTRON MICROSCOPE AND DIFFRACTION STUDY OF METAL CRYSTAL TEXTURES BY MEANS OF THIN SECTIONS
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[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (10) : 993 - 1010
[7] OBSERVATION OF PRIMARY STEP GROWTH IN MAGNESIUM OXIDE BY DIRECT TRANSMISSION ELECTRON MICROSCOPY
MOODIE, AF
WARBLE, CE
[J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (143): : 891 - &
[8] PINSKER ZG, 1953, ELECTRON DIFFRACTION
[9] REFRACTION EFFECTS IN ELECTRON DIFFRACTION
STURKEY, L
FREVEL, LK
[J]. PHYSICAL REVIEW, 1945, 68 (1-2): : 56 - 57
[10] THON F, 1971, ELECTRON MICROSCOPY