INHOMOGENEITIES IN HORIZONTALLY DIPPED LPE (LA,GA) - YIG-FILMS STUDIED BY SPIN-WAVE RESONANCE

A series of films with different dipping times were grown using the LPE method. The [111] GGG substrates were horizontally dipped with a rotation rate of 41 rpm. The saturation magnetization and the lattice mismatch were measured. The uniaxial anisotropy, as determined by the spin wave resonance technique, of both the transient layer and the bulk of each of these films, shows a typical behavior. These phenomena can be interpreted such that when a film grows not only the outside layer changes, but also the bulk of the film changes its properties. Further information has been obtained by a chemical etching experiment. The experimentally obtained spin wave resonance spectra are compared with numerically calculated resonance spectra and reveal that our films are homogeneous throughout the film thickness except for a very small region of 0.5 μm thickness next to the substrate-film interface, which can be understood from the growth kinetics.