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ANNEALING BEHAVIOR OF MANGANESE AND MN-SIO THIN-FILMS

被引：4
作者：
CASTRO, EM
BEYNON, J
机构：
来源：
THIN SOLID FILMS | 1980年 / 66卷 / 02期
关键词：
D O I：
10.1016/0040-6090(80)90232-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：L19 / L20
页数：2
相关论文
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[2]  
BEYNON J, UNPUBLISHED
[3]   STRUCTURAL INVESTIGATIONS OF AMORPHOUS TRANSITION ELEMENT FILMS .2. CHROMIUM, IRON, MANGANESE AND NICKEL [J].
LEUNG, PK ;
WRIGHT, JG .
PHILOSOPHICAL MAGAZINE, 1974, 30 (05) :995-1008
[4]  
MORRIS JE, 1977, THIN SOLID FILMS, V47, P1
[5]   RESISTIVITY-TEMPERATURE VARIATION OF MANGANESE AND MN-MGF2 THIN-FILMS [J].
OLUMEKOR, L ;
BEYNON, J .
THIN SOLID FILMS, 1978, 53 (03) :L9-L11
[6]   A theory of the irreversible electrical resistance changes of metallic films evaporated in vacuum [J].
Vand, V .
PROCEEDINGS OF THE PHYSICAL SOCIETY, 1943, 55 :0222-0246
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