SCATTERING OF X-RAYS NEAR THE K ABSORPTION-EDGE .1. FLUORESCENCE AND RESONANT RAMAN-SCATTERING IN TRANSITION-METALS

被引:43
作者
SUORTTI, P
机构
[1] Department of Physics, University of Helsinki
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1979年 / 91卷 / 02期
关键词
D O I
10.1002/pssb.2220910232
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Formulas for the resonant cross section of X‐rays are rederived emphasizing the similarity of the resonant Raman scattering (RRS) to the fluorescence, and are given in terms of the oscillator strengths and radiative widths. In both processes only a fraction results in radiation, and for the RRS this is termed the RRS yield, wRRS, in analogy with the fluorescence yield, wK. Measurements are made in the symmetrical reflection geometry from totally absorbing samples. The fluorescence yield is measured CuKα as exciting radiation for Ti, V, Cr, Mn, and Fe, the results being 0.237, 0.265, 0.291, 0.325, 0.356, respectively. The absolute cross section of the (1s, 2p) contribution to the RRS is measured for Cr, Mn, Fe, Ni, and Cu at energies 42 to 940 eV below the K absorption edge. The RRS yields are 0.404, 0.426, 0.422, 0.415 (0.460 in another measurement), and 0.473 (0.468), respectively. Also evidence is found for the existence of the (1s, 3p) contribution to the RRS. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA
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页码:657 / 666
页数:10
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