MODIFICATION OF PHILIBERT-TIXIER ZAF CORRECTION FOR GEOLOGICAL SAMPLES

被引:10
作者
FIALIN, M [1 ]
机构
[1] ECOLE NORMALE SUPER,GEOL LAB,CNRS,ER 224,F-75231 PARIS 05,FRANCE
关键词
D O I
10.1002/xrs.1300170306
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
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页码:103 / 106
页数:4
相关论文
共 16 条
[1]  
[Anonymous], ELECT MICROPROBE
[2]   LOCAL COMPOSITIONAL CHANGES IN ALKALI SILICATE GLASSES DURING ELECTRON MICROPROBE ANALYSIS [J].
BOROM, MP ;
HANNEMAN, RE .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (05) :2406-&
[4]  
CAZAUX J, 1986, J MICROSC SPECT ELEC, V11, P293
[5]   NEW RARE-EARTH ELEMENT STANDARDS FOR ELECTRON-MICROPROBE ANALYSIS [J].
DRAKE, MJ ;
WEILL, DF .
CHEMICAL GEOLOGY, 1972, 10 (02) :179-&
[6]  
FIALIN M, 1986, J MICROSC SPECT ELEC, V11, P429
[7]  
HEINRICH KFJ, 1981, ELECTRON BEAM XRAYS, P277
[8]  
Henke B.L., 1974, ADV XRAY ANALYSIS, V17, P150
[9]  
HENOC J, 1972, 6TH ICXOM OS, P113
[10]   ASSESSMENT OF BISHOPS ABSORPTION CORRECTION MODEL IN ELECTRON-PROBE MICROANALYSIS [J].
LOVE, G ;
COX, MGC ;
SCOTT, VD .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (01) :7-13