MATHEMATICAL ANALYSIS OF CROSS-WIRE PROBE MEASUREMENTS

被引：3

作者：

STAPPER, CH

机构：

[1] Components Division, IBM Corporation, Essex Junction Vt

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1969年 / MAG5卷 / 03期

关键词：

D O I：

10.1109/TMAG.1969.1066529

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The cross-wire probe can be used for measuring static magnetic properties in small regions of thin magnetic memory films. This paper gives analytical solutions for the cross-wire probe outputs. The theoretical analysis is based on the ideal rotational switching model for flat films. Results are in excellent agreement with the experimental waveforms obtained in measurements of Hc Hk and skew. © 1969, IEEE. All rights reserved.

引用

页码：648 / &